Statistical Methods for Reliability Data
William Q. Meeker, Luis A. Escobar
Explains computer-based statistical methods for reliability data analysis and test planning for industrial products. Demonstrates how to apply the latest graphical, numerical, and simulation-based methods to a broad range of models found in reliability data analysis, and covers areas such as analyzing degradation data, simulation methods used to complement large-sample asymptotic theory, and data analysis computed with the S-PLUS system. Includes chapter exercises using real data sets. For professionals in product reliability and design, and for graduate students in courses in applied reliability data analysis.
კატეგორია:
წელი:
1998
გამოცემა:
1
გამომცემლობა:
Wiley
ენა:
english
გვერდები:
701
ISBN 10:
0585317240
ISBN 13:
9780585317243
სერია:
Wiley series in probability and statistics. Applied probability and statistics section
ფაილი:
DJVU, 7.85 MB
IPFS:
,
english, 1998
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